SAMPLE PREPARATIONS
PEM / SOM Sample Preparation:  
- Mechanical Polishing  
- Chemical Decapsulation
Cross-Section Sample Preparation:   
- Mechanical polishing  
- Focum Ion Beam (FIB)
TEM Sample Preparation:   
- Mechanical polishing  
- Focum Ion Beam (FIB)
Sputter Coating of sample (Au or Cr)
 
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