SAMPLE PREPARATIONS |
PEM / SOM Sample Preparation:
- Mechanical Polishing
- Chemical Decapsulation |
Cross-Section Sample Preparation:
- Mechanical polishing
- Focum Ion Beam (FIB) |
TEM Sample Preparation:
- Mechanical polishing
- Focum Ion Beam (FIB) |
| Sputter Coating of sample (Au or Cr) |
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